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Facilities

The department is well equipped to carry out state–of–the–art research with facilities such as an NMR centre (300, 400 and 600 MHz instruments), a gas chromatograph–coupled mass spectrometer, atomic absorption spectrometers, mid–IR spectrometers, Fourier Transform IR interferometer, UV–visible spectrometers, X–ray generators and single crystal diffractometers (serial and CD detectors), spectropolarimeter and workstations for both thermal and electrochemical analyses.

Research Services Available

NMR Centre

Bruker Avance III 400 and 600 (with cryoprobe) for recording spectra of magnetically active nuclei for elucidation of molecular structures.

Contact:
Pete Roberts
Tel: (021) 650 2537
E-mail: pete.roberts@uct.ac.za

Infra Red

FT IR Spectrophotometer used to record infra–red spectra on a wide range of samples.

Contact:
A/Prof Gregory Smith
Tel: (021) 650  5279
E-mail: Gregory.Smith@uct.ac.za

Scientific Glass Blowing

This service is available for the greater university. Services include design, manufacturing and repair of a wide range of scientific glassware for research and teaching.

Contact:
Andre De Jager
Tel: (021) 650 2565
E-mail: Andre.DeJager@uct.ac.za

Thermal Analysis

Mettler Toledo TGA/SDTA measures the mass of a sample as it varies with a controlled temperature programme. Software is available to generate both the TGA and the SDTA traces (Mettler).

Perkin Elmer Thermal Analysis System measures the mass of a sample as it varies with a controlled temperature programme. The DSC instrument measures the difference in enthalpy between a sample and a reference as it varies with a controlled temperature programme.

Contact:
Prof Mino Caira
Tel: (021) 650 3071
E-mail: Mino.Caira@uct.ac.za

X–ray Diffraction

Huber Imaging Plate Guinier Camera 670. A compound in the form of a powder is exposed to an X–ray beam. The angular positions and the intensities of the diffracted beams are recorded, producing a characteristic pattern.

Nonius Kappa CCD diffractometer and Bruker Kappa Apex II DUO CCD diffractometer. A single crystal is exposed to a beam of X–rays and the intensities diffracted by the crystal are accurately measured. Subsequent processing of the data and computation leads to the determination of the molecular and crystal structure of the material.

Contact:
Dr Hong Su
Tel: (021) 650 2570
E-mail: Hong.Su@uct.ac.za